Description
Empower your analysis and bring versatility and productivity to your lab with the Thermo Scientific Evolution 220 UV-Vis system. For routine to research analysis, this instrument series offers real innovations that provide enhanced usability and performance – without added complexity. With straightforward software, cutting-edge instrumentation and a wide selection of accessories, the Evolution 220 system works with you to perform experiments the way you want – for the results you need.
Performance Specifications:
Optical Design: Double-beam with sample and reference cuvette positions; Application Focused Beam Geometry; Czerny-TurnerMonochromator
Spectral bandwidths: Variable: 1.0 nm; 2.0 nm; AFBG Microcell optimized; AFBG Fiber optic optimized; AFBG Materials optimized
Light source: Xenon Flash Lamp
Detector: Dual Silicon Photodiodes
Scan ordinate modes: Absorbance, % Transmittance, % Reflectance, Kubelka-Munk, log (1/R), log (Abs), Abs*Factor, Intensity
Wavelength: Range: 190-100 nm; Accuracy: ±0.5 nm (541.9, 546.1 nm mercury lines) ±0.8 nm (full range 190–1100 nm); Repeatability: ≤0.05 nm (546.1 nm mercury line, SD of 10 measurements)
Scanning speed: <1 to 6000 nm/min; variable
Data intervals: 10, 5, 2, 1.0, 0.5, 0.2, 0.1 nm
Photometric: Range: >3.5 A; Display Range: -0.3 to 4.0 A; Accuracy – Instrument: 1A: ±0.004 A, 2A: ±0.008 A, Measured at 440 nm using neutral density filters traceable to NIST; Noise: 0A: ≤0.00015 A 1A: ≤0.00025 A 2A: ≤0.00080 A 260 nm, 1.0 nm SBW, RMS; Drift (Stability): <0.0005 A/hr 500 nm, 1.0 nm SBW, 1 hour warm-up
Stray light: KCl, 198 nm: ≤1% T, NaI, 220 nm: ≤0.05% T, NaNO2, 340 nm: <0.05% T
Baseline flatness: ±0.0010 A, 200–800 nm, 1.0 nm SBW, smoothing
Keypad: Sealed Membrane
Local control option: Optional tablet control module
Dimensions (W x D xH): 62.2 × 48.6 × 27.9 cm (24" × 19" × 11")
Weight: 14.4 kg (32 lb)
Electrical supply: 100–240 V, 50–60 Hz, selected automatically, 150 W maximum
